Bio-sketch


James S. Duncan received the BSEE degree from Lafayette College,
Easton, PA in 1973, the MS degree in Engineering from UCLA in 1975 and
the Ph.D.  degree in Electrical Engineering from the University of
Southern California, in 1982.

In 1973, he joined the staff of Hughes Aircraft Company,
Electro-Optical and Data Systems Group, and participated in research
and development projects related to signal and image processing for
forward looking infrared (FLIR) imaging systems until 1983. During
this time, he held Hughes' Masters, Engineer and Doctoral
Fellowships. In 1983, he joined the faculty of Yale University, New
Haven, CT., where he currently is a Professor of Diagnostic Radiology
and Electrical Engineering, is the Director of the Image Processing
and Analysis Group within Diagnostic Radiology and is the Director of
Undergraduate Studies for the Program in Biomedical Engineering.  His
research and teaching efforts have been in the areas of image
processing, computer vision and medical imaging. His current specific
research interests include the segmentation of deformable structure,
the characterization of nonrigid object motion/deformation using
geometrical and physical models, and the integration of processing
modules in vision systems, all with a special interest in using these
approaches for medical image analysis.

Dr. Duncan is a member of Eta Kappa Nu and Sigma Xi, is on the
editorial board of the Journal of Mathematical Imaging and Vision, and
is currently an Associate Editor for the IEEE Transactions on Medical
Imaging and a co- Editor of the journal  Medical Image
Analysis. In June, 1997, he chaired the international conference on
Information Processing in Medical Imaging (IPMI), held in
Poultney, Vermont.